• DocumentCode
    944543
  • Title

    They come from outer space

  • Author

    Evans-Pughe, Chris

  • Volume
    49
  • Issue
    8
  • fYear
    2003
  • Firstpage
    30
  • Lastpage
    33
  • Abstract
    Today, a system using hundreds of chips could suffer several soft error failures a month, and the problem is set to increase. Why is this and what are the implications?.
  • Keywords
    cosmic ray interactions; failure analysis; integrated circuit reliability; radiation effects; chips; cosmic ray interactions; integrated circuit reliability; outer space; radiation effects; soft error failures;
  • fLanguage
    English
  • Journal_Title
    IEE Review
  • Publisher
    iet
  • ISSN
    0953-5683
  • Type

    jour

  • DOI
    10.1049/ir:20030805
  • Filename
    1281289
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=944543