An Improved Method of Measuring the Current Amplification Factor of Junction Type Transistors

An improved method for measuring the current amplification factor, ¿, of transistors is described. This method combines superior accuracy with ease of operation and use of simple apparatus readily available in most laboratories. It is peculiarly adapted to junction type transistors as the quantity (1-¿) rather than ¿ is measured. Hence, precision of measurement of ¿ is increased as ¿ approaches unity. Superior accuracy is obtained by reading either (1-¿) or ¿ directly from the value of a decade resistor rather than relying on a calibrated meter. Sources of errors and the application of the circuit to measurement of ¿ at carrier frequencies are discussed.