Title :
Fault detection in sequential machines with increased fault coverage
Author :
Das, Sunil R. ; Bhattacharyya, A.
Author_Institution :
National Chiao Tung University, Institute of Computer Science, Hsinchu, Republic of China
Abstract :
This letter develops an approach for fault detection and checking sequence design of sequential machines based on the principle of machine modification through augmentation of extra input and extra outputs, taking into consideration the case where faults occurring in a machine may cause an increase in its number of states.
Keywords :
fault location; sequential machines; fault detection; sequence design; sequential machines;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19780020