• DocumentCode
    944669
  • Title

    Scanning the issue

  • Author

    Claiborne, L.T. ; Kino, G.S. ; Stern, Eric

  • Author_Institution
    Texas Instruments, Inc., Dallas, TX
  • Volume
    64
  • Issue
    5
  • fYear
    1976
  • fDate
    5/1/1976 12:00:00 AM
  • Firstpage
    579
  • Lastpage
    580
  • Abstract
    Provides an overview of the technical articles and features presented in this issue.
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1976.10179
  • Filename
    1454448
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=944669