• DocumentCode
    945012
  • Title

    Analysis of Optically Controlled Microwave/Millimeter-Wave Device Structures

  • Author

    Simons, Rainee N. ; Bhasin, Kul B.

  • Volume
    34
  • Issue
    12
  • fYear
    1986
  • fDate
    12/1/1986 12:00:00 AM
  • Firstpage
    1349
  • Lastpage
    1355
  • Abstract
    Light-induced voltage and the change in the source-to-drain channel current under optical illumination higher than the semiconductor band gap for GaAs MESFET, InP MESFET, Al0.3Ga0.7As/GaAs high electron mobility transistor (HEMT), and GaAs permeable base transistor (PBT) are analytically obtained. The GaAs PBT and GaAs MESFET have higher sensitivity than the InP MESFET. However, the Al0.3Ga0.7As/ GaAs HEMT is observed to have the highest sensitivity. Variations in the small-signal parameters, such as channel conductance, gate-to-source capacitance, and transconductance, as well as transient parameters, such as switching time and power-delay product, of GaAs MESFET with illumination are computed. The computed capacitance and transconductance are compared with the experimentally obtained values and are found to be in fair agreement. Based on these results, the design considerations for an optically controlled MESFET switch are discussed. Finally, variation in device parameter due to optical illumination and its effect on the cutoff frequencies fT and fmax are also investigated.
  • Keywords
    Electron optics; Gallium arsenide; HEMTs; Lighting; MESFETs; Microwave devices; Millimeter wave devices; Optical control; Optical devices; Optical sensors;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.1986.1133548
  • Filename
    1133548