DocumentCode :
945012
Title :
Analysis of Optically Controlled Microwave/Millimeter-Wave Device Structures
Author :
Simons, Rainee N. ; Bhasin, Kul B.
Volume :
34
Issue :
12
fYear :
1986
fDate :
12/1/1986 12:00:00 AM
Firstpage :
1349
Lastpage :
1355
Abstract :
Light-induced voltage and the change in the source-to-drain channel current under optical illumination higher than the semiconductor band gap for GaAs MESFET, InP MESFET, Al0.3Ga0.7As/GaAs high electron mobility transistor (HEMT), and GaAs permeable base transistor (PBT) are analytically obtained. The GaAs PBT and GaAs MESFET have higher sensitivity than the InP MESFET. However, the Al0.3Ga0.7As/ GaAs HEMT is observed to have the highest sensitivity. Variations in the small-signal parameters, such as channel conductance, gate-to-source capacitance, and transconductance, as well as transient parameters, such as switching time and power-delay product, of GaAs MESFET with illumination are computed. The computed capacitance and transconductance are compared with the experimentally obtained values and are found to be in fair agreement. Based on these results, the design considerations for an optically controlled MESFET switch are discussed. Finally, variation in device parameter due to optical illumination and its effect on the cutoff frequencies fT and fmax are also investigated.
Keywords :
Electron optics; Gallium arsenide; HEMTs; Lighting; MESFETs; Microwave devices; Millimeter wave devices; Optical control; Optical devices; Optical sensors;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.1986.1133548
Filename :
1133548
Link To Document :
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