Direct Calibration and Measurement of Microstrip Structures on Gallium Arsenide

Measurements on coupled microstrip line structures on gallium arsenide (GaAs) are described which use a direct launch and calibration standards in the same microstrip medium. Novel techniques are adopted to ensure repeatability and overcome problems of fragility of the substrates. Measurements of the S-parameters show good agreement with theoretical analysis. The theoretical derivation of the S-parameters is summarized in an appendix.