• DocumentCode
    945150
  • Title

    Analysis of monofilament and multifilament samples obtained from Phase I of the SSCL Vendor Qualification Program

  • Author

    Seuntjens, J.M. ; Bardos, V.A. ; Christopherson, D. ; Capone, D.W., II. ; Clark, F.Y. ; Coleman, E.S. ; Erdmann, M.J. ; Headley, T.J. ; Jones, B. ; Levy, V. ; Washburn, D.K.

  • Author_Institution
    Supercond. Super Collider Lab., Dallas, TX, USA
  • Volume
    3
  • Issue
    1
  • fYear
    1993
  • fDate
    3/1/1993 12:00:00 AM
  • Firstpage
    850
  • Lastpage
    854
  • Abstract
    Select samples from each cable vendor in the Superconducting Super Collider. (SSC) Laboratory Vendor Qualification Program were characterized by a series of mechanical and metallographic tests. Samples were chosen to cover the spectrum of monofilament types in each vendor´s process. The tests performed were NbTi alloy hardness, tensile strength of the restack element, tensile properties of the restack element, without the copper, copper to superconductor ratio, barrier X-ray line scans, and NbTi alloy and Nb barrier image analysis. Process data supplied by each cable vendor are also analyzed to obtain extrusion k factor for monofilament and multifilament billets. The data available to date are summarized.<>
  • Keywords
    beam handling equipment; hardness; proton accelerators; storage rings; superconducting cables; superconducting magnets; synchrotrons; tensile strength; type II superconductors; NbTi; Superconducting Super Collider; Vendor Qualification Program; alloy hardness; barrier X-ray line scans; barrier image analysis; billets; metallographic tests; monofilament types; multifilament samples; restack element; superconducting magnet strands; tensile strength; Copper alloys; Laboratories; Mechanical cables; Multifilamentary superconductors; Niobium alloys; Niobium compounds; Qualifications; Superconducting cables; Testing; Titanium compounds;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.233835
  • Filename
    233835