DocumentCode :
945160
Title :
Continuing results of systematic error in I/sub C/ testing
Author :
Erdmann, M.J. ; Capone, D.W., II. ; Seuntjens, J.M.
Author_Institution :
Supercond. Super Collider Lab., Dallas, TX, USA
Volume :
3
Issue :
1
fYear :
1993
fDate :
3/1/1993 12:00:00 AM
Firstpage :
855
Lastpage :
858
Abstract :
Critical current (I/sub C/) testing of the superconducting wire for the Superconducting Super Collider Laboratory (SSCL) is an important concern due to its significance in magnet variability. Established procedures to quantify measurement variability have been adapted to I/sub C/ measurements. To implement these ideas, a round robin experiment was developed and all vendor qualification program participants were required to become certified before the end of Phase II. The authors include updated results from all vendors, including foreign suppliers. The definition of each component of variability, test plan procedure quantifying each component, minimum SSCL certification requirements, current results, and future plans, are reported. Results show that all of the round robin participants have accuracy within the SSCL certified limit of +or-2% of the National Institute of Standards and Technology critical current Standard Reference Material value. Reproducibility results show that all of the test sites have less than a 2% uncertainty with the repeatability results falling between 1 and 3.5%. Cumulative uncertainty is determined to be between 1.5 and 5%.<>
Keywords :
beam handling equipment; critical currents; measurement errors; proton accelerators; storage rings; superconducting cables; superconducting magnets; synchrotrons; I/sub C/ testing; SSCL certification requirements; Superconducting Super Collider; critical current testing; magnet variability; measurement variability; superconducting magnets; superconducting wire; systematic error; uncertainty; Certification; Critical current; Laboratories; NIST; Qualifications; Round robin; Superconducting filaments and wires; Superconducting magnets; System testing; Uncertainty;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.233836
Filename :
233836
Link To Document :
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