Title :
Nitride-based LEDs with an SPS tunneling contact Layer and an ITO transparent contact
Author :
Chang, S.J. ; Chang, C.S. ; Su, Y.K. ; Chuang, R.W. ; Lai, W.C. ; Kuo, C.H. ; Hsu, Y.P. ; Lin, Y.C. ; Shei, S.C. ; Lo, H.M. ; Ke, J.C. ; Sheu, J.K.
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Taman, Taiwan
fDate :
4/1/2004 12:00:00 AM
Abstract :
The indium-tin-oxide [ITO(80 nm)] and Ni(5 nm)-Au(10 nm) films were separately deposited on glass substrates, p-GaN layers, n+-InGaN-GaN short-period-superlattice (SPS) structures, and nitride-based light-emitting diodes (LEDs). It was found that ITO on n+-SPS structure could provide us an extremely high transparency (i.e., 93.2% at 465 nm) and also a reasonably small specific contact resistance of 1.6×10-3Ω·cm2. Although the forward voltage which corresponds to 20-mA operating current for LED with ITO on n+-SPS upper contact was slightly higher than that of the LED with Ni-Au on n+-SPS upper contact, a 30% higher output intensity could still be achieved by using ITO on n+-SPS upper contact. Moreover, the output power of packaged LED with ITO was about twice as large as that of the other conventional Ni-Au LEDs.
Keywords :
III-V semiconductors; contact resistance; gallium compounds; gold; indium compounds; light emitting diodes; nickel; optical films; p-n heterojunctions; semiconductor superlattices; substrates; transparency; 10 nm; 465 nm; 5 nm; 80 nm; ITO transparent contact; ITO-GaN; ITO-InGaN-GaN; InSnO-GaN; InSnO-InGaN-GaN; Ni-Au films; NiAu-GaN; NiAu-InGaN-GaN; SPS tunneling contact layer; glass substrates; indium-tin-oxide films; light-emitting diode; nitride-based LEDs; output intensity; short-period-superlattice structures; specific contact resistance; transparency; Conducting materials; Contact resistance; Gallium nitride; Glass; Indium tin oxide; Light emitting diodes; Optical materials; Power generation; Tunneling; Voltage;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2004.824667