Title :
Predicted absorptance of YBa/sub 2/Cu/sub 3/O/sub 7//YSZ/Si multilayer structures for infrared detectors
Author :
Zhang, Z.M. ; Flik, M.I.
Author_Institution :
Dept. of Mech. Eng., MIT, Cambridge, MA, USA
fDate :
3/1/1993 12:00:00 AM
Abstract :
High-T/sub c/ superconducting YBa/sub 2/Cu/sub 3/O/sub 7/ films deposited on silicon substrates with yttria-stabilized-zirconia (YSZ) buffer layers have significant potential for radiation detectors. The infrared absorptance of a YBa/sub 2/Cu/sub 3/O/sub 7//YSZ/Si multilayer structure, which strongly influences the detector performance and depends on the layer thicknesses, is analyzed here. The electromagnetic field inside the layers is determined based on the Maxwell equations and the optical constants of these materials. The film thicknesses yielding maximum absorptance are obtained for different wavelengths. The spatial distribution of power flux is determined by integrating the Poynting vector over a finite spectral region. The analytical method presented in this study is recommended for the radiative design of high-T/sub c/ superconducting detectors based on absorbing multilayer structures.<>
Keywords :
Maxwell equations; barium compounds; high-temperature superconductors; infrared detectors; infrared spectra of inorganic solids; optical constants; silicon; superconducting epitaxial layers; yttrium compounds; zirconium compounds; Maxwell equations; Poynting vector; Si substrate; YBa/sub 2/Cu/sub 3/O/sub 7/-Y/sub 2/O/sub 3/ZrO/sub 2/-Si; analytical method; buffer layers; electromagnetic field; epitaxial layers; film thicknesses; high temperature superconductor; infrared absorptance; multilayer structure; optical constants; power flux spatial distribution; radiation detectors; semiconductor; Buffer layers; Infrared detectors; Nonhomogeneous media; Optical films; Semiconductor films; Silicon; Substrates; Superconducting epitaxial layers; Superconducting films; Superconducting photodetectors;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
