Long-term reliability of pure silica core single-mode fiber when exposed to high-power laser light

Author

Kurokawa, K. ; Fukai, C. ; Zhou, J. ; Tajima, K. ; Nakajima, K. ; Yoshizawa, N. ; Sankawa, I.

Author_Institution

NTT Access Network Service Syst. Labs., Ibaraki, Japan

Volume

16

Issue

4

fYear

2004

fDate

4/1/2004 12:00:00 AM

Firstpage

1110

Lastpage

1112

Abstract

The reliability of a pure silica core single-mode fiber with long-term exposure to continuous wave (CW) high-power laser light is reported. It is found that the optical loss in the 0.6-1.6-μm region and the Raman spectrum remain unchanged after 1900 h of exposure to 8-W CW laser light at 1.48 μm. The nonbridging oxygen hole center concentration generated by 1900 h of exposure is estimated to be below our detection limit of 2×10/sup 12/ cm/sup -3/.

Keywords

Raman spectra; laser beam effects; optical fibre losses; optical fibre testing; reliability; silicon compounds; 0.6 to 1.6 mum; 1900 h; 8 W; 8-W cw laser light; Raman spectrum; SiO/sub 2/; continuous wave high-power laser light; high-power laser light exposure; long-term reliability; nonbridging oxygen hole center concentration; optical loss; pure silica core single-mode fiber; Fiber lasers; Fiber nonlinear optics; Optical fiber losses; Optical fiber polarization; Optical fiber testing; Optical fibers; Optical pumping; Optical scattering; Silicon compounds; Stimulated emission;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/LPT.2004.824626

Filename

1281887