Title :
An Experimental Verification of a Simple Distributed Model of MIM Capacitors for MMIC Applications
Author :
Mondal, Jyoti P.
fDate :
4/1/1987 12:00:00 AM
Abstract :
A distributed model has been derived for MIM capacitors using a simple coupled-transmission-line approach. The model has been compared with measured S-parameter data from MIM capacitors having different aspect ratios fabricated on 4-mil GaAs substrates. The agreement is very good. The derived model will converge to the first-order capacitor model, generally given in the literature, under a few assumptions.
Keywords :
Capacitance; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Frequency measurement; Loss measurement; MIM capacitors; MMICs; Q factor; Scattering parameters;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1987.1133662
