Reproducibility of niobium junction critical currents: statistical analysis and data

Author

Smith, A.D. ; Thomasson, S.L. ; Dang, C.

Author_Institution

TRW Space & Technology Group, Redondo Beach, CA, USA

Volume

3

Issue

1

fYear

1993

fDate

3/1/1993 12:00:00 AM

Firstpage

2174

Lastpage

2177

Abstract

The authors present a statistical model to account for Josephson-junction critical current variability produced in integrated circuit processing. On the basis of data gathered from over a thousand junctions from the TRW superconducting integrated-circuit foundry line, it is shown that present niobium technology can produce junctions with critical currents identical to within a few percent, depending on junction size. Less than 2% (1 sigma ) spread critical currents were measured for 10 mu m junctions.<>

Keywords

Josephson effect; critical currents; integrated circuit manufacture; niobium; statistical analysis; superconducting integrated circuits; superconducting junction devices; type II superconductors; Josephson-junction; Nb junctions; critical current reproducibility; critical current variability; integrated circuit processing; statistical model; Critical current; Critical current density; Current density; Josephson junctions; Manufacturing processes; Niobium; Reproducibility of results; Space technology; Statistical analysis; Superconducting integrated circuits;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.233934

Filename

233934