DocumentCode :
946774
Title :
Switching probability of QFP comparators as a function of exciter slew-rate
Author :
Ruby, R. ; Lee, G. ; Ko, H. ; Barfknecht, A.
Author_Institution :
Hewlett-Packard Lab., Palo Alto, CA, USA
Volume :
3
Issue :
1
fYear :
1993
fDate :
3/1/1993 12:00:00 AM
Firstpage :
2694
Lastpage :
2697
Abstract :
The current noise (inferred from switching probabilities) of quantum flux parametron (QFP) comparators has been measured as a function of exciter slew rates. It was found that at high slew rates the switching probability follows an error-function distribution quite closely. However, at low slew rates, the distribution resembles a Fermi-Dirac distribution. Good agreement with Monte-Carlo simulations for high slew-rates is seen with a current noise proportional to the Johnson noise of the damping resistors. The current noise decreases with decreasing slew rate and is in good agreement with thermal activation calculations in the limit of slow slew rates.<>
Keywords :
Josephson effect; SQUIDs; comparators (circuits); electron device noise; probability; switching; DC SQUID latch; Fermi-Dirac distribution; Johnson noise; Monte-Carlo simulations; QFP comparators; current noise; damping resistors; error-function distribution; exciter slew-rate; quantum flux parametron; switching probabilities; thermal activation calculations; Circuits; Clocks; Electronics packaging; Latches; Potential energy; Probability distribution; SQUIDs; Superconducting device noise; Switches; Timing;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.233982
Filename :
233982
Link To Document :
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