Title :
Rigorous Analysis and Network Modeling of the Inset Dielectric Guide
Author :
Rozzi, T. ; Hedges, Stephen J.
fDate :
9/1/1987 12:00:00 AM
Abstract :
The inset dielectric guide (IDG) is an easy-to-fabticate alternative to image line and is also less sensitive to loss by radiation at discontinuities. This paper presents a rigorous variational analysis in space domain based on field and network considerations (transverse resonance diffraction). This approach yields an accurate transverse equivalent network for the fundamental mode suitable for evaluation by a desktop calculator. Theoretical and experimental results are in excellent agreement.
Keywords :
Circuits; Costs; Dielectric losses; Diffraction; Image analysis; Integral equations; Manufacturing; Moment methods; Propagation losses; Resonance;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1987.1133759