DocumentCode :
947713
Title :
Self-aligned, emitter-edge-passivated AlGaAs/GaAs heterojunction bipolar transistors with extrapolated maximum oscillation frequency of 350-GHz
Author :
Ho, W.J. ; Wang, N.L. ; Chang, M.F. ; Sailer, Alfons ; Higgins, J.A.
Author_Institution :
Rockwell Int. Sci. Center, Thousand Oaks, CA
Volume :
39
Issue :
11
fYear :
1992
fDate :
11/1/1992 12:00:00 AM
Firstpage :
2655
Abstract :
Summary form only given. The authors present self-aligned, emitter-edge-passivated AlGaAs/GaAs heterojunction bipolar transistors (HBTs) with extrapolated maximum oscillation frequency of 350 GHz. To the authors´ knowledge, this is the highest fmax ever reported for an HBT. The self-aligned, emitter-edge-passivated dual-liftoff process reported here enhances the device RF performance and DC current gain. The current gain of a typical HBT with 2 emitter fingers each 2 μm×10 μm was measured to be more than 20 at current density of 5×104 cm2. A record high maximum oscillation frequency of 350 GHz was extrapolated by assuming 6-dB/octave falloff rate from the unilateral gains obtained from the s-parameters measured up to 40 GHz
Keywords :
III-V semiconductors; S-parameters; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; solid-state microwave devices; 350 GHz; AlGaAs-GaAs; DC current gain; RF performance; current density; dual-liftoff process; heterojunction bipolar transistors; maximum oscillation frequency; s-parameters; self aligned emitter edge passivated HBT; Current density; Current measurement; Density measurement; Fingers; Gain measurement; Gallium arsenide; Global warming; Heterojunction bipolar transistors; Performance gain; Radio frequency;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.163515
Filename :
163515
Link To Document :
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