DocumentCode :
947996
Title :
High-speed InGaAs/InP composite collector bipolar transistors
Author :
Feygenson, A. ; Hamm, R.A. ; Ritter, Daniel ; Smith, Peter ; Montgomery, R.K. ; Yadvish, R.D. ; Temkin, H.
Author_Institution :
AT&T Bell Labs., Murray Hill, NJ
Volume :
39
Issue :
11
fYear :
1992
fDate :
11/1/1992 12:00:00 AM
Firstpage :
2658
Abstract :
Summary form only given. The authors describe a composite collector bipolar transistor structure capable of high-speed and high breakdown voltage (BVCEO). The structure uses a composite collector of InGaAs and InP. fT=120 GHz at VCE=1.5 V at a current density of 77 kA/cm2 were obtained. The breakdown voltage BVCEO is greater than 5 V, and the output conductance is essentially independent of the collector voltage. Microwave transistors with an emitter size of 3×10 μm2 were fabricated by a self-aligned process. Microwave measurements were made from 100 MHz to 40 GHz as a function of the collector current and VCE. The authors have also fabricated and tested transimpedance amplifiers based on the composite collector transistors
Keywords :
III-V semiconductors; gallium arsenide; heterojunction bipolar transistors; indium compounds; solid-state microwave devices; 1.5 V; 100 MHz to 40 GHz; 120 GHz; 26 GHz; 5 V; InGaAs-InP; collector voltage; composite collector bipolar transistors; current density; cutoff frequency; high breakdown voltage; high-speed; microwave transistors; output conductance; self-aligned process; transimpedance amplifiers; Bandwidth; Bipolar transistors; Epitaxial growth; Gain; Indium gallium arsenide; Indium phosphide; Microwave transistors; Planarization; Substrates; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.163520
Filename :
163520
Link To Document :
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