DocumentCode :
948068
Title :
Modulation characteristics of InP-based MQW lasers: the impact of biaxial compressive and tensile strain
Author :
Nichols, David ; Davis, Lisa ; Lam, Y. ; Espinosa, Eduardo ; Singh, Jaskirat ; Bhattacharya, Pallab
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI
Volume :
39
Issue :
11
fYear :
1992
fDate :
11/1/1992 12:00:00 AM
Firstpage :
2661
Lastpage :
2662
Abstract :
Summary form only given. The authors relate observed modulation characteristics of strained InxGa1-xAs-InP (0.33⩽x⩽0.73) MQW (multi-quantum-well) separate-confinement-heterostructure (SCH) lasers to properties of the band structures of biaxially strained InxGa1-xAs quantum wells. The differential gain was found to increase significantly for both compressive and tensile strain with respect to its lattice-matched value, indicating that strained devices will have larger 3-dB bandwidths than their lattice-matched counterparts. The authors have also measured the microwave responses of both strained and lattice-matched devices and found that the bandwidth of the lattice-matched devices are 3 and 5 GHz for devices with 63% In in the quantum wells. In addition, by measuring the turn-on delay time at various levels of drive current, the authors have measured a spontaneous lifetime of 0.78 ns for compressively strained ridge waveguide devices. They also calculated Auger coefficients for devices with 73% In in the wells
Keywords :
III-V semiconductors; deformation; gallium arsenide; indium compounds; optical modulation; optical waveguides; semiconductor lasers; 3 GHz; 5 GHz; Auger coefficients; InxGa1-xAs-InP; InP based SCH lasers; MQW lasers; band structures; bandwidth; biaxial compressive strain; differential gain; microwave responses; modulation characteristics; ridge waveguide devices; semiconductor lasers; separate-confinement-heterostructure; strained multiquantum wells; tensile strain; Bandwidth; Current measurement; Delay effects; Microwave devices; Microwave measurements; Propagation delay; Quantum well devices; Quantum well lasers; Tensile strain; Time measurement;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.163526
Filename :
163526
Link To Document :
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