Title :
Comments on "Efficient and Robust Feature Extraction by Maximum Margin Criterion
Author :
Liu, Jun ; Chen, Songcan ; Tan, Xiaoyang ; Zhang, Daoqiang
Author_Institution :
Nanjing Univ. of Aeronaut. & Astronautics, Nanjing
Abstract :
The goal of this comment is to first point out two loopholes in the paper by Li (2006): (1) so-designed efficient maximal margin criterion (MMC) algorithm for small sample size (SSS) problem is problematic and (2) the discussion on the equivalence with the null-space-based methods in SSS problem does not hold. Then, we will present a really efficient MMC algorithm for SSS problem.
Keywords :
computational complexity; feature extraction; feature extraction; maximum margin criterion algorithm; null-space-based method; small sample size problem; two loophole; Application software; Computer science; Euclidean distance; Face recognition; Feature extraction; Image storage; Null space; Robustness; Scattering; Technological innovation; Efficient algorithm; equivalence; maximal margin criterion (MMC); null space; small sample size (SSS) problem;
Journal_Title :
Neural Networks, IEEE Transactions on
DOI :
10.1109/TNN.2007.900813
