Title :
Bias-Dependent Microwave Characteristics of Atomic Planar-Doped AIGaAs/InGaAs/GaAs Double Heterojunction MODFET´s (Short Paper)
Author :
Chen, Y.K. ; Wang, G.W. ; Radulescu, D.C. ; Lepore, A.N. ; Tasker, P.J. ; Eastman, L.F. ; Strid, Eric
fDate :
12/1/1987 12:00:00 AM
Abstract :
Double heterojunction AIGaAs/InGaAs/GaAs modulation-doped field effect transistors (MODFET´s) using lattice-strained AIGaAs/InGaAs/GaAs layer structure have been fabricated and evaluated at microwave frequencies for various bias conditions. MODFET´s with a 1-µm gate length show a room-temperature peak extrinsic dc transconductance (gm) of 400 mS/mm with a full channel current of 610 mA/mm. For 0.3-µm-gate MODFET´s an extrinsic dc gm of 505 mS/mm and a full channel current of 720 mAmm were obtained. Devices having a 1-µm gate length show a maximum available gain cutoff frequency (fmax) of 85 GHz and a current-gain cutoff frequency (fT) of 22 GHz from S-parameter measurements. The 0.3-µm devices show an fT of 45 GHz and an fmax of 120 GHz. Bias-dependent equivalent circuit models are also discussed.
Keywords :
Atomic layer deposition; Cutoff frequency; Gallium arsenide; HEMTs; Heterojunctions; Indium gallium arsenide; MODFETs; Microwave frequencies; Scattering parameters; Transconductance;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1987.1133874