DocumentCode :
948380
Title :
Automatic Process Control with Radiation Gauges
Author :
Faulkner, W. Harrison, Jr. ; Ziffer, Garret F. ; Corwin, Gilbert
Author_Institution :
Tracerlab, Inc., Boston, Massachusetts
fYear :
1957
fDate :
3/1/1957 12:00:00 AM
Firstpage :
76
Lastpage :
81
Abstract :
The optimum automatic process control system requires a continuous flow of information relating to the process variations. Radiation gauges utilizing absorption or scattering of radiation produced by a radioisotope source as a means of measuring thickness, weight per unit area, or density of a product offer a means for obtaining this information. Process control utilizing these gauges differs from the usual control system in that large delays exist between the measuring point and the control point. The existence of such delays requires the use of specialized control systems, usually utilizing interrupted control. A typical control system of this type is described and the safety precautions required to prevent malfunction or damage are discussed.
Keywords :
Area measurement; Control systems; Delay; Density measurement; Electromagnetic wave absorption; Process control; Radioactive materials; Scattering; Thickness measurement; Weight measurement;
fLanguage :
English
Journal_Title :
Industrial Electronics, IRE Transactions on
Publisher :
ieee
ISSN :
0197-5706
Type :
jour
DOI :
10.1109/IRE-IE.1957.5007787
Filename :
5007787
Link To Document :
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