• DocumentCode
    948467
  • Title

    Strain-induced effects on the performance of AlGaInP visible lasers

  • Author

    Hashimoto, Jun-ichi ; Katsuyama, Tsukuru ; Yoshida, Ichiro ; Hayashi, Hideki

  • Author_Institution
    Sumitomo Electric Ind. Ltd., Kanagawa, Japan
  • Volume
    29
  • Issue
    6
  • fYear
    1993
  • fDate
    6/1/1993 12:00:00 AM
  • Firstpage
    1863
  • Lastpage
    1868
  • Abstract
    The strain-induced reduction of the threshold current density (Jth) of AlGaInP visible lasers was investigated. Strained multiple-quantum-well (SMQW) and unstrained MQW AlGaInP broad contact lasers were fabricated using low-pressure organometallic vapor phase epitaxy (OMVPE). To evaluate the strain-induced effects, AlGaInP compressively strained quantum wells were introduced into the active region of the SMQW laser, making the energy band structure of the SMQW laser almost the same as that of the MQW one. Comparing the J th of both lasers at the same lasing wavelength showed that, for cavity lengths between 300 and 700 μm, more than a 4% decrease in Jth was obtained by incorporating the SMQW structures, and the maximum reduction of 6% was achieved at 500 μm. In addition, it was shown that, in the SMQW laser, the considerable decrease in the transparency current density J0 contributes effectively toward Jth reduction
  • Keywords
    III-V semiconductors; aluminium compounds; gallium compounds; indium compounds; laser beams; optical workshop techniques; semiconductor lasers; vapour phase epitaxial growth; 300 to 700 micron; AlGaInP; OMVPE; active region; broad contact lasers; compressively strained quantum wells; energy band structure; low-pressure organometallic vapor phase epitaxy; multiple quantum well lasers; semiconductor lasers; strain-induced effects; threshold current density; transparency current density; visible lasers; Current density; Diode lasers; Epitaxial growth; Gallium arsenide; Light sources; Optical recording; Performance evaluation; Quantum well devices; Quantum well lasers; Threshold current;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.234445
  • Filename
    234445