Title : 
Selection of Reliability Levels in Equipment Design
         
        
            Author : 
Garbarino, Harold L.
         
        
            Author_Institution : 
Elec. Eng. Dept., Armour Research Foundations, Illinois Inst. of Tech., Chicago, Ill.
         
        
        
            fDate : 
4/1/1958 12:00:00 AM
         
        
        
        
            Keywords : 
Analog computers; Control systems; Ducts; Electronic equipment; Feedback loop; Industrial electronics; Open loop systems; Stability; Temperature control; Temperature dependence;
         
        
        
            Journal_Title : 
Industrial Electronics, IRE Transactions on
         
        
        
        
        
            DOI : 
10.1109/IRE-IE.1958.5007809