Dielectric property measurement system at cryogenic temperature and microwave frequencies

Author

Mollá, Joaquín ; Ibarra, Angel ; Margineda, Jose ; Zamarro, J.M. ; Hernández, Adela

Author_Institution

Euratom-Ciemat Assoc., Madrid, Spain

Volume

42

Issue

4

fYear

1993

fDate

8/1/1993 12:00:00 AM

Firstpage

817

Lastpage

821

Abstract

A system based on the resonant cavity method has been developed to measure the permittivity and loss tangent at 12-18 GHz over the temperature range 80-300 K. Changes of permittivity as low as 0.01% in the range 1-30, 3x10^-6 for loss tangent values below 10^-2, can be measured without requiring temperature stability. The thermal expansion coefficient and resistivity factor of copper have been measured between 80 K and 300 K. The permittivity of sapphire and loss tangent of alumina of 99.9% purity in the same temperature range are presented

Keywords

aluminium compounds; cavity resonators; copper; dielectric loss measurement; low-temperature techniques; microwave measurement; permittivity measurement; 12 to 18 GHz; 80 to 300 K; Al₂O₃; Cu; alumina; cryogenic temperature; loss tangent; microwave frequencies; permittivity; resistivity factor; resonant cavity; sapphire; thermal expansion coefficient; Cryogenics; Dielectric loss measurement; Dielectric measurements; Loss measurement; Permittivity measurement; Resonance; Stability; Temperature distribution; Temperature measurement; Thermal expansion;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.234491

Filename

234491