• DocumentCode
    948930
  • Title

    A switched-capacitor successive-approximation A/D converter

  • Author

    Ogawa, Satomi ; Watanabe, Kenzo

  • Author_Institution
    Res. Inst. of Electron., Shizuoka Univ., Hamamatsu, Japan
  • Volume
    42
  • Issue
    4
  • fYear
    1993
  • fDate
    8/1/1993 12:00:00 AM
  • Firstpage
    847
  • Lastpage
    853
  • Abstract
    A switched-capacitor successive-approximation analog-to-digital (A/D) converter that incorporates a serial digital-to-analog (D/A) subconverter for generating the threshold voltage sequence is developed. The conversion process is insensitive to parasitic capacitances and offset voltages of the comparator and operational amplifiers. Error analyses and Spice simulations show that a resolution higher than 11 b, a sampling rate up to 440 ksamples/s with 10-b resolution, and a power consumption less than 60 mW are attainable with monolithic implementation using present CMOS technologies. The required chip area is small because of a low device count. The architecture described is therefore best suited for high-accuracy, medium-speed A/D converters in application-specific integrated circuits (ASICs). A prototype converter breadboarded using discrete components has confirmed the principles of operation
  • Keywords
    CMOS integrated circuits; SPICE; analogue-digital conversion; circuit CAD; digital simulation; switched capacitor networks; 60 mW; ASICs; CMOS; Spice simulations; application-specific integrated circuits; error analyses; monolithic implementation; offset voltages; parasitic capacitances; prototype converter; serial D/A subconvertor; switched-capacitor successive-approximation A/D converter; threshold voltage sequence; Analog-digital conversion; Analytical models; CMOS technology; Energy consumption; Error analysis; Operational amplifiers; Parasitic capacitance; Sampling methods; Switching converters; Threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.234496
  • Filename
    234496