Title :
Long-term lifetests of c.w. (AlGa)As laser diodes at room temperature
Author :
Ettenberg, M. ; Kressel, H. ; Ladany, I.
Author_Institution :
RCA Laboratories, Princeton, USA
Abstract :
Real-time lifetest data are given for a group of c.w. laser diodes operated continuously for periods as long as 4 years. Out of 24 lasers studied, four lasers have failed to date. This failure rate is compared with accelerated lifetests at 70°C; an estimated m.t.t.f. of ¿ 105 hours at room temperature is obtained.
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; reliability; semiconductor device testing; semiconductor junction lasers; AlGaAs; continuous wave laser diodes; failure rate; lifetest data; reliability; semiconductor junction lasers;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19780550
