Title :
TM scattering from a slit in a thick conducting screen: revisited
Author :
Kang, Soo H. ; Eom, Hyo J. ; Park, Tah J.
Author_Institution :
Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea
fDate :
5/1/1993 12:00:00 AM
Abstract :
TM plane wave scattering from a slit in a thick conducting screen is examined. A Fourier transform technique is employed to express the scattered field in the spectral domain and the boundary conditions are enforced to obtain simultaneous equations for the transmitted field inside the thick conducting screen. The simultaneous equations are solved to represent the transmitted and scattered fields in series forms. Approximate series solutions for scattering and transmission are obtained in closed-forms which are valid for high-frequency scattering regime
Keywords :
Fourier transforms; electromagnetic wave scattering; Fourier transform technique; TM scattering; boundary conditions; closed-forms; high-frequency scattering regime; plane wave scattering; scattered field; simultaneous equations; spectral domain; thick conducting screen; transmitted field; Conductors; Copper; Electromagnetic scattering; Finite difference methods; Frequency; Microwave theory and techniques; Rough surfaces; Surface resistance; Surface roughness; Surface treatment;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
