Title :
Bayes Optimality in Linear Discriminant Analysis
Author :
Hamsici, Onur C. ; Martinez, Aleix M.
Author_Institution :
Ohio State Univ., Columbus
fDate :
4/1/2008 12:00:00 AM
Abstract :
We present an algorithm that provides the one-dimensional subspace, where the Bayes error is minimized for the C class problem with homoscedastic Gaussian distributions. Our main result shows that the set of possible one-dimensional spaces v, for which the order of the projected class means is identical, defines a convex region with associated convex Bayes error function g(v). This allows for the minimization of the error function using standard convex optimization algorithms. Our algorithm is then extended to the minimization of the Bayes error in the more general case of heteroscedastic distributions. This is done by means of an appropriate kernel mapping function. This result is further extended to obtain the d dimensional solution for any given d by iteratively applying our algorithm to the null space of the (d - l)-dimensional solution. We also show how this result can be used to improve upon the outcomes provided by existing algorithms and derive a low-computational cost, linear approximation. Extensive experimental validations are provided to demonstrate the use of these algorithms in classification, data analysis and visualization.
Keywords :
Bayes methods; optimisation; pattern recognition; Bayes optimality; associated convex Bayes error function; convex optimization; data analysis; data visualization; homoscedastic Gaussian distributions; linear approximation; linear discriminant analysis; pattern recognition; Bayes optimal; Linear discriminant analysis; convex optimization; data mining; data visualization; feature extraction; pattern recognition; Algorithms; Artificial Intelligence; Bayes Theorem; Computer Simulation; Discriminant Analysis; Image Enhancement; Image Interpretation, Computer-Assisted; Linear Models; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2007.70717