In-flight observations of the radiation environment and its effects on devices in the SAC-C polar orbit

Author

Falguére, D. ; Boscher, D. ; Nuns, T. ; Duzellier, S. ; Bourdarie, S. ; Ecoffet, R. ; Barde, S. ; Cueto, J. ; Alonzo, C. ; Hoffman, C.

Author_Institution

Space Environ. Dept., ONERA, Toulouse, France

Volume

49

Issue

6

fYear

2002

fDate

12/1/2002 12:00:00 AM

Firstpage

2782

Lastpage

2787

Abstract

This paper presents particle flux measurements and single event effect (SEE) data obtained with Influence of Space Radiation on Advanced Components (ICARE) on the SAC-C orbit (707 km, 98.2°) for the period November 2000-June 2002. An increase of 10 MeV proton flux in the belts is clearly observed and correlated to solar proton events associated with magnetic storms. SEU rate measurements are presented for SRAM and DRAM devices, and their response to solar events shows SEU rate increases (up to a factor of 115) correlated with high-energy protons (E≥84 MeV).

Keywords

DRAM chips; SRAM chips; integrated circuit reliability; magnetic storms; proton effects; space vehicle electronics; 10 MeV; 707 km; 84 MeV; DRAM; ICARE; Influence of Space Radiation on Advanced Components; SAC-C polar orbit; SEE; SEU rate measurements; SRAM; in-flight observations; magnetic storms; particle flux measurements; proton flux; radiation environment; single event effect data; solar proton events; Central Processing Unit; Detectors; Extraterrestrial measurements; Instruments; Magnetic field measurement; Particle measurements; Protons; Random access memory; Single event upset; Weather forecasting;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2002.805380

Filename

1134220