Title :
A new formula for the discrete-time system stability test
Author :
Chen, C.F. ; Tsay, Y.T.
Author_Institution :
University of Houston, Houston, TX
Abstract :
It is known that while the stability criteria for discrete data systems such as the Schur-Cohn, the Jury, and the Inner tests are complicated in form, the bilinear transformation with the Routh array test is involved in calculation. This note develops a matrix for the binomial product expansion and establishes an inner product formula for evaluating the coefficients of the w polynomial. The new approach enables the use of Routh criterion stability study in discrete time systems as simple and easy as in the continuous case.
Keywords :
Data systems; Discrete time systems; Electrons; Frequency; Integral equations; Phase measurement; Polynomials; Stability criteria; System testing; Transfer functions;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1977.10668