• DocumentCode
    949953
  • Title

    Eigenmode analysis of optical waveguides by a Yee-mesh-based imaginary-distance propagation method for an arbitrary dielectric interface

  • Author

    Ando, Takashi ; Nakayama, Hiroki ; Numata, Satoshi ; Yamauchi, Junji ; Nakano, Hisamatsu

  • Author_Institution
    Fac. of Eng., Hosei Univ., Koganei, Japan
  • Volume
    20
  • Issue
    8
  • fYear
    2002
  • fDate
    8/1/2002 12:00:00 AM
  • Firstpage
    1627
  • Lastpage
    1634
  • Abstract
    A modified finite-difference (FD) formula for an arbitrary dielectric interface is applied to an imaginary-distance propagation method based on Yee´s mesh. To confirm the validity of the modified method, we first analyze the eigenmode of a step-index circular fiber. A reduction in a discretization error is demonstrated in the evaluation of the field profile. Calculations of the normalized propagation constant show that the convergence rate of the modified FD formula is faster than that of traditional techniques and is comparable to that of a body-of-revolution technique. As a further application, we analyze the eigenmodes of sloped-side rib guides. These data agree well with previously published data.
  • Keywords
    Maxwell equations; convergence of numerical methods; eigenvalues and eigenfunctions; finite difference methods; optical fibre theory; optical waveguide theory; rib waveguides; Maxwell equations; Yee-mesh-based imaginary-distance propagation method; arbitrary dielectric interface; body-of-revolution technique; convergence rate; discretization error; eigenmode analysis; field profile; modified finite-difference formula; normalized propagation constant; optical waveguides; sloped-side rib guides; step-index circular fiber; Dielectrics; Electromagnetic waveguides; Finite difference methods; Image analysis; Maxwell equations; Optical propagation; Optical scattering; Optical waveguides; Propagation constant; Time domain analysis;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2002.800360
  • Filename
    1058179