Title :
Full CMOS video line-locked phase-locked loop system
Author :
Rodda, W.E. ; Campbell, E.R. ; Sauer, D.J. ; Mayweather, W.T. ; Dell´Ova, F.
Author_Institution :
David Sarnoff Res. Center, Princeton, NJ, USA
Abstract :
A CMOS PLL (phase-locked loop) system for generation of a television line-locked clock in the frequency range 25 MHz to 40 MHz is described. The PLL system is designed for use as a generic building block with large-scale CMOS video signal processing integrated circuits. The development of a custom test chip version of the PLL system is reported. A test chip version of the PLL system has been fabricated in 0.8 μm CMOS technology and tested to verify functionality and examine acquisition and racking behavior. The test chip version of the PLL includes a bidirectional test bus monitor system used to observe 28 signals and input five signals for the purpose of assessing circuit operation details. The open-loop measured noise bandwidth of the RC VCO (voltage-controlled oscillator) is -30 dB at 350 Hz. The short term stability within one second is approximately ±150 Hz or 20 p.p.m., corresponding to 1.3 ns jitter in one horizontal line period of 63.5 μs
Keywords :
CMOS integrated circuits; image processing equipment; phase-locked loops; variable-frequency oscillators; video signals; 0.8 micron; 1.3 ns; 25 to 40 MHz; 63.5 mus; CMOS; acquisition behaviour; bidirectional test bus monitor system; digital signal processing; integrated circuits; jitter; open-loop measured noise bandwidth; racking behavior; short term stability; television line-locked clock; video line-locked phase-locked loop; video signal processing; voltage-controlled oscillator; CMOS technology; Circuit testing; Clocks; Frequency; Large scale integration; Phase locked loops; Signal design; System testing; TV; Voltage-controlled oscillators;
Journal_Title :
Consumer Electronics, IEEE Transactions on