DocumentCode :
950009
Title :
Robust Real-Time Pattern Matching Using Bayesian Sequential Hypothesis Testing
Author :
Pele, Ofir ; Werman, Michael
Author_Institution :
Sch. of Comput. Sci. & Eng., Hebrew Univ. of Jerusalem, Jerusalem
Volume :
30
Issue :
8
fYear :
2008
Firstpage :
1427
Lastpage :
1443
Abstract :
This paper describes a method for robust real-time pattern matching. We first introduce a family of image distance measures, the Image Hamming Distance Family. Members of this family are robust to occlusion, small geometrical transforms, light changes, and nonrigid deformations. We then present a novel Bayesian framework for sequential hypothesis testing on finite populations. Based on this framework, we design an optimal rejection/acceptance sampling algorithm. This algorithm quickly determines whether two images are similar with respect to a member of the Image Hamming Distance Family. We also present a fast framework that designs a near- optimal sampling algorithm. Extensive experimental results show that the sequential sampling algorithm´s performance is excellent. Implemented on a Pentium IV 3 GHz processor, the detection of a pattern with 2,197 pixels in 640times480 pixel frames, where in each frame the pattern rotated and was highly occluded, proceeds at only 0.022 seconds per frame.
Keywords :
Bayes methods; image matching; image sampling; statistical testing; Bayesian framework; Bayesian sequential hypothesis testing; Pentium IV 3 GHz processor; image Hamming distance; optimal rejection-acceptance sampling algorithm; robust real-time pattern matching; Bayesian statistics; Hamming distance; composite hypothesis; finite populations; image similarity measures; image statistics; pattern detection; pattern matching; real time; sequential hypothesis testing; template matching; Algorithms; Artificial Intelligence; Bayes Theorem; Computer Systems; Image Enhancement; Image Interpretation, Computer-Assisted; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.2007.70794
Filename :
4359387
Link To Document :
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