Laser-induced and heavy ion-induced single-event transient (SET) sensitivity measurements on 139-type comparators

Author

LaLumondiere, Stephen D. ; Koga, Rocky ; Yu, Paul ; Maher, Michael C. ; Moss, Steven C.

Author_Institution

Aerosp. Corp., Los Angeles, CA, USA

Volume

49

Issue

6

fYear

2002

fDate

12/1/2002 12:00:00 AM

Firstpage

3121

Lastpage

3128

Abstract

We have measured the single-event transient (SET) response for a number of 139-type comparators with differing topologies. In this paper, we present the results from pulsed laser measurements on a number of different 139-type devices, as well as heavy ion measurements on a new RM139 device from NSC. Devices tested with the laser included the HS-139RH, PM139, LM139 and a more recent version of LM139 from NSC. We discuss the effects of different device topologies on SET sensitivity. Our results agree qualitatively with SPICE model calculations of LM139s by Johnston et al.

Keywords

comparators (circuits); ion beam effects; laser beam effects; HS-139RH; LM139; PM139; RM139; analog integrated circuit; comparator device; heavy ion irradiation; pulsed laser irradiation; single-event transient response; Aerospace testing; Laser excitation; Laser modes; Logic devices; Metallization; Optical pulses; Pulse measurements; SPICE; Topology; Virtual manufacturing;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2002.805414

Filename

1134270