DocumentCode :
950424
Title :
V.P.E. GaAs m.e.s.f.e.t. structure using oxygen injection during buffer layer growth
Author :
Bruch, H. ; Palm, L. ; Ponse, F. ; Balk, P.
Author_Institution :
Aachen Technical University, Institute of Semiconductor Electronics, SFB 56, Aachen, West Germany
Volume :
15
Issue :
9
fYear :
1979
Firstpage :
246
Lastpage :
247
Abstract :
GaAs m.e.s.f.e.t. structures with high-resistivity buffer layers were prepared by introducing oxygen into the deposition system during growth. The electrical properties of the buffer layers are independent of the oxygen content of the gas phase over a large range of partial pressures. The characteristics of devices prepared with such layers are excellent.
Keywords :
Schottky gate field effect transistors; gallium arsenide; vapour phase epitaxial growth; GaAs; MESFET; VPE; buffer layer growth; deposition system; gas phase;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19790174
Filename :
4243181
Link To Document :
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