Title :
Ultrasonic attenuation of piezoelectric PVF2 films at high frequencies
Author :
Khuri-Yakub, Butrus T. ; Chou, C.H.
Author_Institution :
Stanford University, Stanford, USA
Abstract :
The ultrasonic attenuation of polyvinylidene fluoride (PVF2) piezoelectric films has been measured at high frequencies (150¿450 MHz). It was observed that the propagation loss varies linearly with frequency. The ultrasonic Q of the PVF2 films is constant and equal to 19. It is thus possible to use PVF2 films for high-frequency applications.
Keywords :
Q-factor; piezoelectric thin films; polymers; ultrasonic absorption; 150 to 450 MHz; US Q-factor 19; high frequencies; piezoelectric PVF2 films; piezoelectric thin films; polyvinylidene fluoride; propagation loss proportional to frequency; ultrasonic attenuation;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19790218
