Title :
Correspondence: Comments on "1/f Noise in Metal Contacts and Granular Resistors"
Author :
Vandamme, L.K.J.
Author_Institution :
University of Technology,Netherlands
fDate :
6/1/1987 12:00:00 AM
Abstract :
A model is presented in the above paper based on temperature fluctuations of the small conducting spots inducing conductivity fluctuations. The observed experimental results are in qualitative agreement with those of the model. In this comment arguments will be presented which are at variance with the temperature fluctuation model. Their experimental results can be described by the empirical 1/f noise relation.
Keywords :
Contacts; Thick-film circuit noise; Thick-film resistors; Charge measurement; Contact resistance; Copper; Current measurement; Fluctuations; Q measurement; Resistors; Temperature distribution; Thermal resistance; Voltage;
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCHMT.1987.1134718
