Title :
X-ray emission and prebreakdown currents in plain and dielectric bridged vacuum gaps under DC excitation
Author :
Jaitly, N.C. ; Sudarshan, Tangali S.
Author_Institution :
Dept. of Electr. & Comput. Eng., South Carolina Univ., Columbia, SC, USA
fDate :
4/1/1988 12:00:00 AM
Abstract :
X-ray activity in both plain and solid insulator bridged-vacuum gaps was investigated under DC stresses. The gap conditions under which X-ray emission takes place, and the correlation between X-ray activity and predischarge current were studied. Steady X-ray activity was observed for a plain gap with electrodes subjected to repeated breakdowns, and for gaps bridged with insulators having low secondary emission yields. The hysteresis in the V-I characteristics of both plain and bridged vacuum gaps is attributed to a regenerative feedback process between X-ray and photoemission processes. The nonresistive component of predischarged current for bridge vacuum gaps obeys the Fowler-Nordheim theory only in the high-field region (>60 kV/cm), and only in the absence of X-ray activity. Chromium oxide coatings on Wesgo AL-300 alumina ceramic gave a substantial improvement (>100%) in the voltage hold-off, but at the expense of increased prebreakdown current and X-ray activity. It has been shown that chromium oxide coatings do not improve the voltage hold-off unless a dense, low porosity, surface is produced by the coating
Keywords :
X-ray production; chromium compounds; electric breakdown; spark gaps; Al2O3; Cr2O3 coatings; DC excitation; Fowler-Nordheim theory; V-I characteristics; Wesgo AL-300 alumina ceramic; X-ray emission; dielectric bridged vacuum gaps; gap conditions; high-field region; hysteresis; photoemission processes; plain vacuum gaps; prebreakdown currents; predischarge current; regenerative feedback; secondary emission yields; voltage hold-off; Chromium; Coatings; Dielectrics and electrical insulation; Electric breakdown; Electrodes; Feedback; Hysteresis; Solids; Stress; Voltage;
Journal_Title :
Electrical Insulation, IEEE Transactions on