Title :
Nondestructive refractive-index profile measurement of elliptical optical fibre or preform
Author_Institution :
University of New South Wales, School of Electrical Engineering, Kensington, Australia
Abstract :
A nondestructive method of determining the refractive-index profile of an elliptic optical fibre or preform is reported. For the fibre, the pathlength data obtained from interference microscopic measurement are used. For the preform, the ray exit angles are used. These data are put into an integral that can be inverted numerically to obtain the reconstructed profile.
Keywords :
optical fibres; refractive index measurement; elliptical optical fibre; elliptical optical fibre preforms; interference microscopic measurement; nondestructive method; ray exit angles; refractive index profile measurement;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19790254
