A Lorentz microscopic study of head-on domain walls

Lorentz microscopic techniques were used to examine the structure and the behavior of saw-tooth head-on domain walls under external stimuli. New experimental techniques were developed for this investigation. Head-on walls were formed and manipulated, both magnetically and mechanically, in situ under an electron microscope. The microscopic structure of the head-on walls in films ∼250 Å thick was cross-tie in nature, and the width of the domain wall was m. The behavior of the head-on wall under external stimuli was found to be independent of the saw-tooth amplitude, which can be varied from microns to millimeters in a given film.