DocumentCode :
951238
Title :
Electrical Conduction Mechanisms of Barium-Titanate-Based Thick-Film Capacitors
Author :
Yoo, In K. ; Burton, Larry C. ; Stephenson, F. William
Author_Institution :
Virginia Polytechnic Institute and State University,Blacksburg
Volume :
10
Issue :
2
fYear :
1987
fDate :
6/1/1987 12:00:00 AM
Firstpage :
274
Lastpage :
282
Abstract :
Electrical characteristics, including degradation, of high K ( 
500) barium-titanate-based thick-film capacitors were studied. The leakage current of thick-film capacitors made from Ag/Pd thick-film conducting paste and high K dielectric has shown ohmic and super-ohmic (3/2 power voltage dependence) type behavior. Voltage independence of thermal activation energy and time dependence of leakage current were also observed. A healing effect by reversal of bias polarity and the effect of humidity on leakage current have also been studied. Models for leakage currents that increase with time are presented.
500) barium-titanate-based thick-film capacitors were studied. The leakage current of thick-film capacitors made from Ag/Pd thick-film conducting paste and high K dielectric has shown ohmic and super-ohmic (3/2 power voltage dependence) type behavior. Voltage independence of thermal activation energy and time dependence of leakage current were also observed. A healing effect by reversal of bias polarity and the effect of humidity on leakage current have also been studied. Models for leakage currents that increase with time are presented.Keywords :
Component reliability; Thick-film capacitors; Capacitors; Degradation; Electrodes; Fabrication; Grain boundaries; High K dielectric materials; High-K gate dielectrics; Leakage current; Temperature dependence; Voltage;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/TCHMT.1987.1134731
Filename :
1134731
Link To Document :
