DocumentCode :
951281
Title :
Improved performance of long-wavelength strained bulk-like semiconductor lasers
Author :
Jones, Gareth ; O´Reilly, Eoin P.
Author_Institution :
Dept. of Phys., USurrey Univ., Guildford, UK
Volume :
29
Issue :
5
fYear :
1993
fDate :
5/1/1993 12:00:00 AM
Firstpage :
1344
Lastpage :
1354
Abstract :
The authors show that the incorporation of either tensile or compressive strain can have significant advantages for long-wavelength bulk-like lasers, with greater advantage being achieved in tensile-strained structures. The differential gain is enhanced compared to unstrained structures and a larger peak gain can be achieved than in comparable structures under biaxial compression. The effect of the spin-orbit interaction on the polarized gain and character of the valence states is calculated as a function of built-in strain. The spin-split-off band is included in the calculations and it is shown that the strain-induced interaction with this band has a significant influence on laser characteristics. The effect of biaxial strain on the major intrinsic loss mechanism of Auger recombination in long-wavelength 1.55-μm lasers is investigated
Keywords :
Auger effect; deformation; electron-hole recombination; laser theory; light polarisation; optical losses; semiconductor lasers; 1.55 micron; Auger recombination; Auger threshold activation energies; IR; biaxial strain; built-in strain; compressive strain; differential gain; larger peak gain; laser characteristics; long-wavelength strained bulk-like semiconductor lasers; major intrinsic loss mechanism; polarized gain; spin-orbit interaction; spin-split-off band; tensile-strained structures; valence states; Capacitive sensors; Laser theory; Polarization; Quantum well lasers; Radiative recombination; Semiconductor lasers; Spontaneous emission; Tellurium; Tensile strain; Threshold current;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.236148
Filename :
236148
Link To Document :
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