• DocumentCode
    951281
  • Title

    Improved performance of long-wavelength strained bulk-like semiconductor lasers

  • Author

    Jones, Gareth ; O´Reilly, Eoin P.

  • Author_Institution
    Dept. of Phys., USurrey Univ., Guildford, UK
  • Volume
    29
  • Issue
    5
  • fYear
    1993
  • fDate
    5/1/1993 12:00:00 AM
  • Firstpage
    1344
  • Lastpage
    1354
  • Abstract
    The authors show that the incorporation of either tensile or compressive strain can have significant advantages for long-wavelength bulk-like lasers, with greater advantage being achieved in tensile-strained structures. The differential gain is enhanced compared to unstrained structures and a larger peak gain can be achieved than in comparable structures under biaxial compression. The effect of the spin-orbit interaction on the polarized gain and character of the valence states is calculated as a function of built-in strain. The spin-split-off band is included in the calculations and it is shown that the strain-induced interaction with this band has a significant influence on laser characteristics. The effect of biaxial strain on the major intrinsic loss mechanism of Auger recombination in long-wavelength 1.55-μm lasers is investigated
  • Keywords
    Auger effect; deformation; electron-hole recombination; laser theory; light polarisation; optical losses; semiconductor lasers; 1.55 micron; Auger recombination; Auger threshold activation energies; IR; biaxial strain; built-in strain; compressive strain; differential gain; larger peak gain; laser characteristics; long-wavelength strained bulk-like semiconductor lasers; major intrinsic loss mechanism; polarized gain; spin-orbit interaction; spin-split-off band; tensile-strained structures; valence states; Capacitive sensors; Laser theory; Polarization; Quantum well lasers; Radiative recombination; Semiconductor lasers; Spontaneous emission; Tellurium; Tensile strain; Threshold current;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.236148
  • Filename
    236148