DocumentCode
951289
Title
Identification of band-edge optical transition types in tensile strained quantum wells
Author
Baliga, Arvind ; Anderson, Neal G.
Author_Institution
Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
Volume
29
Issue
5
fYear
1993
fDate
5/1/1993 12:00:00 AM
Firstpage
1355
Lastpage
1363
Abstract
A new characterization technique based on photoluminescence excitation spectroscopy (PLE) which allows simple and direct identification of band-edge transition types in quantum wells is developed. A ratio curve is generated by pointwise division of one PLE spectrum by a second PLE spectrum. The two PLE spectra are obtained using orthogonal polarizations of the excitation beam, which is incident on the sample surface at an oblique angle, and the transition types near the band edge are identified by simple visual inspection of the ratio curve. The authors describe and assess the theoretical foundation for the ratio method, detail the experimental procedure, present PLE spectra and ratio curves for several quantum wells, and determine optimum experimental conditions and the physical origin of features in the ratio curve through investigation of the influence of several experimental parameters
Keywords
deformation; luminescence of inorganic solids; photoluminescence; semiconductor quantum wells; spectroscopy; SQW; band-edge optical transition types; excitation beam; oblique angle; orthogonal polarizations; photoluminescence excitation spectroscopy; pointwise division; ratio curve; ratio method; semiconductor quantum wells; tensile strained quantum wells; visual inspection; Absorption; Inspection; Optical devices; Optical mixing; Optical modulation; Optical polarization; Optical sensors; Photoluminescence; Spectroscopy; Stimulated emission;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/3.236149
Filename
236149
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