DocumentCode
951353
Title
Cryogenic magnetic properties of secondary recrystallized thin sheet dysprosium
Author
Swift, Wayne M. ; Mathur, Mahendra P.
Author_Institution
Westinghouse Research Laboratories, Pittsburgh, Pa.
Volume
10
Issue
2
fYear
1974
fDate
6/1/1974 12:00:00 AM
Firstpage
308
Lastpage
313
Abstract
Secondary recrystallization was observed in 0.25mm thick dysprosium sheet having final cold reductions in the range of 40-60% prior to annealing at 1150°C in a dry helium atmosphere. X-ray and etch-pit studies revealed a predominant (0001)[
] secondary recrystallized texture. Magnetization curves at 4.2 K and 77 K were in good agreement with (0001)[
] single crystal magnetization curves. Coercivity measured from a peak induction of 3.1 T was 1.9 × 103A/m at 77K, but increased to 16 × 103A/m at 4.2K measured from a peak induction of 3.3 T. Square loop behavior was observed at 4.2 K, whereas low ratios of remanent magnetization to tip magnetization were observed at 77 K. The magnetization behavior is explained by domain models consistent with the single crystal magnetization curves, the temperature dependency of the (0001) magnetocrystalline anisotropy, and Egami\´s concept of an intrinsic wall coercivity in dysprosium at temperatures near 0 K.
] secondary recrystallized texture. Magnetization curves at 4.2 K and 77 K were in good agreement with (0001)[
] single crystal magnetization curves. Coercivity measured from a peak induction of 3.1 T was 1.9 × 103A/m at 77K, but increased to 16 × 103A/m at 4.2K measured from a peak induction of 3.3 T. Square loop behavior was observed at 4.2 K, whereas low ratios of remanent magnetization to tip magnetization were observed at 77 K. The magnetization behavior is explained by domain models consistent with the single crystal magnetization curves, the temperature dependency of the (0001) magnetocrystalline anisotropy, and Egami\´s concept of an intrinsic wall coercivity in dysprosium at temperatures near 0 K.Keywords
Cryogenic measurements; Crystal growth; Dysprosium; Magnetization processes; Annealing; Atmosphere; Atmospheric measurements; Coercive force; Cryogenics; Etching; Helium; Magnetic properties; Magnetization; Temperature dependence;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1974.1058335
Filename
1058335
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