Title :
Losses in silicon-iron
Author :
Sharp, Michael R G ; Overshott, Kenneth J.
Author_Institution :
University of Wales Institute of Science and Technology, Cardiff, Wales
fDate :
6/1/1974 12:00:00 AM
Abstract :
Measurements of total power loss and domain-wall spacing have been made on individual grains in polycrystalline specimens of commercial grain-oriented 3% silicon-iron material. The loss-per-cycle against frequency characteristic of a grain is found to consist of discrete linear portions, which correspond to different domain-wall spacings. These changes in domain pattern result in a lower value of static hysteresis loss than expected and, therefore, a larger proportion of the total power loss must be attributed to the anomalous loss. From domain observations, it is concluded that a part of the anomalous loss is due to nonuniform flux distribution in the material and the overloading of the well-oriented grains.
Keywords :
Magnetic losses; Silicon-iron alloys; Crystallization; Frequency; Iron; Loss measurement; Magnetic hysteresis; Magnetic materials; Materials science and technology; Power measurement; Shape; Soft magnetic materials;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1974.1058346