Title :
Fault detection in Moore-model sequential machine using counter-cycle technique
Author :
Bhattacharyya, A.
Author_Institution :
Delhi College of Engineering, Department of Electrical Engineering, Delhi, India
Abstract :
The letter considers the applicability of the counter-cycle technique for the fault detection of a Moore-model sequential machine. It also covers the types of faults that may increase the number of states of the machine.
Keywords :
logic testing; sequential machines; Moore model sequential machine; counter cycle technique; fault detection; logic testing;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19790289
