DocumentCode :
951573
Title :
Energy-efficient soft error-tolerant digital signal processing
Author :
Shim, Byonghyo ; Shanbhag, Naresh R.
Author_Institution :
Illinois Univ., Urbana, IL, USA
Volume :
14
Issue :
4
fYear :
2006
fDate :
4/1/2006 12:00:00 AM
Firstpage :
336
Lastpage :
348
Abstract :
In this paper, we present energy-efficient soft error-tolerant techniques for digital signal processing (DSP) systems. The proposed technique, referred to as algorithmic soft error-tolerance (ASET), employs low-complexity estimators of a main DSP block to achieve reliable operation in the presence of soft errors. Three distinct ASET techniques - spatial, temporal and spatio-temporal- are presented. For frequency selective finite-impulse response (FIR) filtering, it is shown that the proposed techniques provide robustness in the presence of soft error rates of up to P/sub er/=10/sup -2/ and P/sub er/=10/sup -3/ in a single-event upset scenario. The power dissipation of the proposed techniques ranges from 1.1 X to 1.7 X (spatial ASET) and 1.05 X to 1.17 X (spatio-temporal and temporal ASET) when the desired signal-to-noise ratio SNR/sub des/=25 dB. In comparison, the power dissipation of the commonly employed triple modular redundancy technique is 2.9 X.
Keywords :
FIR filters; fault tolerance; signal processing; spatiotemporal phenomena; DSP; FIR filtering; algorithmic soft error-tolerance; digital signal processing; energy-efficient soft error-tolerant techniques; frequency selective finite-impulse response filtering; low-complexity estimators; reduced precision redundancy; reliability; spatial technique; spatio-temporal technique; temporal technique; Digital signal processing; Energy efficiency; Error analysis; Filtering; Finite impulse response filter; Frequency; Power dissipation; Robustness; Signal processing algorithms; Signal to noise ratio; Digital signal processing (DSP); low-power; reduced precision redundancy (RPR); reliability; soft error tolerance; triple modular redundancy (TMR);
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2006.874359
Filename :
1637464
Link To Document :
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