DocumentCode
951670
Title
The Mechanisms that Provide Corrosion Protection for Silicone Gel Encapsulated Chips
Author
Otsuka, Kanji ; Takeo, Y. ; Yamada, Tomoaki ; Kuroda, Sho
Author_Institution
Hitachi, Ltd., Ome-shi, Tokyo, Japan
Volume
10
Issue
4
fYear
1987
fDate
12/1/1987 12:00:00 AM
Firstpage
666
Lastpage
671
Abstract
Plastic molded packages have difficulty achieving high reliability with pin counts over 100 pins. Plastic pin-grid-array packages with pin-embedded printed circuit boards have been previously reported with silicone gel encapsulation that have both high reliability and low cost, and their development has been previously reported. The full detail of the relationship between reliability and process variations has only recently become better understood. Under some situations, voids can form in the gel coatings during the severe changes of temperature and pressure in autoclave "pressure cooker" accelerated testing. The procedures for avoidance of these voids and the effects of outside contamination of the package are discussed.
Keywords
Corrosion; Integrated circuit packaging; Silicone materials/devices; Coatings; Corrosion; Costs; Encapsulation; Life estimation; Pins; Plastic packaging; Printed circuits; Protection; Temperature;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/TCHMT.1987.1134772
Filename
1134772
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