• DocumentCode
    951670
  • Title

    The Mechanisms that Provide Corrosion Protection for Silicone Gel Encapsulated Chips

  • Author

    Otsuka, Kanji ; Takeo, Y. ; Yamada, Tomoaki ; Kuroda, Sho

  • Author_Institution
    Hitachi, Ltd., Ome-shi, Tokyo, Japan
  • Volume
    10
  • Issue
    4
  • fYear
    1987
  • fDate
    12/1/1987 12:00:00 AM
  • Firstpage
    666
  • Lastpage
    671
  • Abstract
    Plastic molded packages have difficulty achieving high reliability with pin counts over 100 pins. Plastic pin-grid-array packages with pin-embedded printed circuit boards have been previously reported with silicone gel encapsulation that have both high reliability and low cost, and their development has been previously reported. The full detail of the relationship between reliability and process variations has only recently become better understood. Under some situations, voids can form in the gel coatings during the severe changes of temperature and pressure in autoclave "pressure cooker" accelerated testing. The procedures for avoidance of these voids and the effects of outside contamination of the package are discussed.
  • Keywords
    Corrosion; Integrated circuit packaging; Silicone materials/devices; Coatings; Corrosion; Costs; Encapsulation; Life estimation; Pins; Plastic packaging; Printed circuits; Protection; Temperature;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/TCHMT.1987.1134772
  • Filename
    1134772