Title :
Special section on autonomous silicon validation and testing of microprocessors and microprocessor-based systems
fDate :
4/1/2006 12:00:00 AM
Abstract :
Provides notice of upcoming special issues of interest to practitioners and researchers.
Keywords :
Microprocessors; Silicon; Special issues and sections; System testing;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2006.877608
