Title :
Quality test of semiconductor memories by jitter measurement
Author_Institution :
Technische Hochschule Darmstadt, Institut fÿr Ã\x9cbertragungstechnik Abteilung Elektronische Schaltungen, Darmstadt, West Germany
Abstract :
This letter states the results form the application of a jitter measuring method suited to the quality testing of electronic semiconductor memories. A description is given of a jitter measuring apparatus which enables detection of latent defects in semiconductor memories.
Keywords :
field effect integrated circuits; integrated circuit testing; integrated memory circuits; logic testing; quality control; read-only storage; EPROM; MOS; faulty bonding; jitter measurement; latent defects; leakage current paths; measuring apparatus; moisture effect; quality testing; semiconductor memories; surface contamination;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19790307
